EDITORIAL
Scanning
                      Probe Microscopy in Materials Research 
ICMAT 2007
                      Conference (International Conference on Materials for
                      Advanced Technology) Symposium G: 
 Guest
                      Editor: N. Chandrasekhar 
J. Scann. Probe Microsc.
                      2, (i) (2007) 
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                    RESEARCH ARTICLES
A
                      Well Defined Electron Beam Source Produced by the
                      Controlled Field Assisted Etching of Metal Tips to <1
                      nm Radius 
 Moh'd Rezeq, Jason Pitters, and
                      Robert Wolkow 
J. Scann. Probe Microsc. 2, 14
                      (2007) 
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                    Scanning Probe Microscopy for
                      Surface Roughness Characterization of 
Lactose
                      Carriers Used in Dry Powder Inhalation Therapy 
                      A. D. Karande, Q. Zhou, L. W. Chan, P. W. S. Heng, and
                      C. V. Liew 
J. Scann. Probe Microsc. 2, 59
                      (2007) 
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                    Structural Integrity and Transport
                      Characteristics of STM-Defined, Highly-Doped Si:P Nanodots
                      
 Frank J. Rueß, Wilson Pok, Thilo C. G.
                      Reusch, Giordano Scappucci, Martin Füchsle, Mladen
                      Mitic, 
Daniel L. Thompson, and Michelle Y. Simmons
                      
J. Scann. Probe Microsc. 2, 1014 (2007)
                      
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                    Nanoscale Acoustic Near-Field
                      Imaging in an SEM/SPM Hybrid System with Sub-Picometer
                      Sensitivity 
 Ch. Thomas, R. Heiderhoff, and
                      L. J. Balk 
J. Scann. Probe Microsc. 2, 1518
                      (2007) 
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                    Study and Manipulation of Single
                      Functionalized Molecules by Low Temperature STM 
                      L. Grill, M. Alemani, K.-H. Rieder, F. Moresco, G.
                      Rapenne, C. Joachim, M. V. Peters, and S. Hecht 
J.
                      Scann. Probe Microsc. 2, 1923 (2007) 
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                    Surface Characterization of TaN-Cu
                      Nanocomposite Thin Films Using Scanning Surface Potential
                      Microscopy 
 J. H. Hsieh, P. C. Liu, M. K.
                      Cheng, and P. W. Kuo 
J. Scann. Probe Microsc. 2,
                      2427 (2007) 
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                    Effects of Tip Voltage and Writing
                      Speed on the Formation of Silicon Oxide Nanodots 
Patterned
                      by Scanning Probe Lithography 
 Sabar D.
                      Hutagalung, Teguh Darsono, Khatijah A. Yaacob, and Zainal
                      A. Ahmad 
J. Scann. Probe Microsc. 2, 2831
                      (2007) 
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                    Polymerization on DNA Templates for
                      Nanoelectronics Applications 
 S. R. Rajwade,
                      P. D. Kulkarni, S. Mukherji, K. K. Rao, and V. Ramgopal
                      Rao 
J. Scann. Probe Microsc. 2, 3235 (2007)
                      
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                    Morphological and Interfacial
                      Investigations at Ni/Si System 
 Shivani
                      Agarwal, Ankur Jain, N. Karar, B. R. Chakraborty, Ajay
                      Gupta, and I. P. Jain 
J. Scann. Probe Microsc. 2,
                      3640 (2007) 
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                    GENERAL RESEARCH
                      ARTICLES
Dynamics of Phospholipid Membrane
                      Growth and Drug-Membrane Interactions Probed by 
Atomic
                      Force Microscopy 
 Matthew R. Nussio, Matthew
                      Liddell, Matthew J. Sykes, John O. Miners, and Joseph G.
                      Shapter 
J. Scann. Probe Microsc. 2, 4145
                      (2007) 
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                    Vorticella Stalk Characterization
                      via Atomic Force Microscopy 
 M. F. Andrade,
                      M. Valdez, A. Virgen-Ortiz, X. Trujillo, M. Huerta, and J.
                      L. Marin 
J. Scann. Probe Microsc. 2, 4650
                      (2007) 
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                    Imaging of Pristine and
                      Functionalized Carbon Nanotubes by Scanning Tunneling
                      Microscopy 
 Guoxiu Wei, Mark T. Greiner, and
                      Peter Kruse 
J. Scann. Probe Microsc. 2, 5157
                      (2007) 
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                    Atomic Force Microscopy Studies of
                      Silver Nanoislands Synthesised from Aspergillus versicolor
                      
 C. Gopalakrishnan, Shivaraman Ramaswamy, and
                      Usha Memoriya 
J. Scann. Probe Microsc. 2, 5862
                      (2007) 
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                    Table of Contents to Volume 2,
                      Number 12, 2007
J. Scann. Probe Microsc. 2,
                      63 (2007) 
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                    Author Index to Volume 2, Number 12,
                      2007 
J. Scann. Probe Microsc. 2, 6465
                      (2007) 
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                    Subject Index to Volume 2, Number 12,
                      2007 
J. Scann. Probe Microsc. 2, 66 (2007) 
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